Load displacement and high speed nanoindentation data set at different state of charge (SoC) for spinel LixMn2O4 cathodes
Author(s): Mughal, Muhammad Zeeshan,Moscatelli, Riccardo,Sebastiani, Marco

Published in: Elsevier Data in Brief 2016

Permanent ID: pmc:PMC4898909,doi:10.1016/j.dib.2016.05.034,pmid:27331088

Combinatorial refinement of thin-film microstructure, properties and process conditions: iterative nanoscale search for self-assembled TiAlN nanolamellae
Author(s): Zalesak, J.,Todt, J.,Pitonak, R.,Köpf, A.,Weißenbacher, R.,Sartory, B.,Burghammer, M.,Daniel, R.,Keckes, J.

Published in: International Union of Crystallography EISSN: 1600-5767 2016

Permanent ID: doi:10.1107/S1600576716017258,pmc:PMC5139999,pmid:27980517

Universal concept for the optimization of step sizes in manufacturing processes
Author(s): Senn, Melanie,Schweizer, Frank,Pfeiffer, Wulf

Published in: Elsevier BV Fraunhofer IWM 2015

Permanent ID: doi:10.1016/j.procir.2015.03.028

Experimental and modelling characterisation of residual stresses in cylindrical samples of rapidly cooled bulk metallic glass
Author(s): Korsunsky, Alexander M.,Sui, Tan,Salvati, Enrico,George, Easo P.,Sebastiani, Marco

Published in: Elsevier BV Materials & Design, Vol 104, Iss , Pp 235-241 (2016) 2016

Permanent ID: doi:10.1016/j.matdes.2016.05.017

Digital image correlation of 2D X-ray powder diffraction data for lattice strain evaluation
Author(s): Zhang, Hongjia,Sui, Tan,Salvati, Enrico,Daisenberger, Dominik,Lunt, Alexander J. G.,Fong, Kai Soon,Song, Xu,Korsunsky, Alexander M.

Published in: MDPI Zhang , H , Sui , T , Salvati , E , Daisenberger , D , Lunt , A J G , Fong , K S , Song , X & Korsunsky , A M 2018 , ‘ Digital image correlation of 2D X-ray powder diffraction data for lattice strain evaluation ‘ , Materials , vol. 11 , no. 3 , 427 . https://doi.org/10.3390/ma11030427 2018

Permanent ID: pmc:PMC5873006,pmid:29543728,urn:uri:442a3183-a5ef-4872-b450-afb95be67922,doi:10.3390/ma11030427

X-ray nanodiffraction analysis of stress oscillations in a W thin film on through-silicon via
Author(s): Todt , J.,Hammer , H.,Sartory , B.,Burghammer , M.,Kraft , J.,Daniel , R.,Keckes , J.,Defregger , S.

Published in: International Union of Crystallography EISSN: 1600-5767 2016

Permanent ID: pmid:26937239,doi:10.1107/S1600576715023419,pmc:PMC4762567

On the origins of strain inhomogeneity in amorphous materials
Author(s): Korsunsky, Alexander M.,Lunt, Alexander J. G.,Chater, Philip

Published in: Nature Publishing Group UK Scientific Reports 2018

Permanent ID: pmid:29371622,urn:uri:a89ddb95-9fe6-4635-a01e-1f1db1530b20,pmc:PMC5785546,doi:10.1038/s41598-018-19900-2

A Comparison of Microscale Techniques for Determining Fracture Toughness of LiMn2O4 Particles
Author(s): Mughal, Muhammad Zeeshan,Amanieu, Hugues-Yanis,Moscatelli, Riccardo,Sebastiani, Marco

Published in: MDPI Materials 2017

Permanent ID: pmc:PMC5506937,pmid:28772763,doi:10.3390/ma10040403

Nanoscale Origins of the Size Effect in the Compression Response of Single Crystal Ni-Base Superalloy Micro-Pillars
Author(s): Ying, S,Ma, L,Sui, T,Papadaki, C,Salvati, E,Brandt, LMPR,Zhang, H,Korsunsky, AM

Published in: MDPI AG Materials, Vol 11, Iss 4, p 561 (2018) 2018

Permanent ID: urn:uri:f0095e2d-4c30-4e87-9b6f-8ceee2ec5ba8,doi:10.3390/ma11040561,pmc:PMC5951445,pmid:29621189